Browsing by Author "Temst, Kristiaan"
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Publication A growth and morphology study of organic vapor phase deposited perylene diimide thin films for transistor applications
Journal article2010, Journal of Physical Chemistry C, (114) 6, p.2730-2737Publication ALD on high mobility channels: engineering the proper gate stack passivation
Meeting abstract2010, 218th ECS Meeting Symposium ' Atomic Layer Deposition Applications 6', 10/10/2010, p.1401Publication Assessment of Ge1-xSnx alloys for strained Ge CMOS devices
Proceedings paper2010-10, SiGe, Ge, and Related Compounds: Materials, Processing, and Devices, 10/10/2010, p.529-535Publication Atomic layer deposition of high-k dielectrics on sulphur-passivated germanium
Journal article2011, Journal of the Electrochemical Society, (158) 7, p.H687-H692Publication Atomistic Modeling of Spin and Electron Dynamics in Two-Dimensional Magnets Switched by Two-Dimensional Topological Insulators
Journal article2023, PHYSICAL REVIEW APPLIED, (19) 1, p.Art. 014040Publication BiFeO3 thin films via aqueous solution depostion: a study of phase formation and stabilization
Journal article2015, Journal of Materials Science, 50, p.4463-4476Publication Correlating the polymorphism of titanyl phthalocyanine thin films with solar cell performance
Journal article2012, Journal of Physical Chemistry Letters, 3, p.2395-2400Publication Correlation between morphology and electrical characteristics of organic vapor phase deposited PTCDI-C13 thin film transistors
Proceedings paper2010, International Conference on Organic Electronics - ICOE, 22/06/2010Publication Crystalline properties and strain relaxation mechanism of CVD grown GeSn
Journal article2013, ECS Journal of Solid State Science and Technology, (2) 4, p.P134-P137Publication Crystalline properties and strain relaxation mechanism of CVD grown GeSn
Proceedings paper2012, SiGe, Ge, and Related Compunds 5: Materials, Processing, and Devices, 7/10/2012, p.875-883Publication Crystalline properties and strain relaxation mechanism of CVD grown GeSn
Meeting abstract2012, ECS Fall Meeting Symposium: SiGe, Ge, and Related Compounds: Materials, Processing, and Devices, 7/10/2012, p.3213Publication Development of the Ni(001) surface morphology upon low energy Ar+ ion bombardment
Meeting abstract2009, 16th International Summer School on Vacuum, Electron and Ion Technologies, 28/09/2009Publication Electronic voltage control of magnetic anisotropy at room temperature in high-k SrTiO3\Co\Pt trilayer
Journal article2020, Physical Review Materials, (4) 11, p.114415Publication Elemental redistribution of Pt and Pd in nickel silicides: a comparative study
Meeting abstract2012, Materials for Advanced Metallization - MAM, 11/03/2012, p.O4-4Publication Enabling the high-performance InGaAs/Ge CMOS: a common gate stack solution
Proceedings paper2009, IEEE International Electron Device Meeting - IEDM, 7/12/2009, p.327-330Publication Enhanced SOT Efficiency in Pt/Co Systems with a NiO Interlayer for SOT-MRAM
Proceedings paper2024, IEEE International Magnetics Conference (INTERMAG), MAY 05-10, 2024Publication Epitaxial growth of magnetron sputtered NiAl on Ge mediated by native GeOx
Journal article2024, JOURNAL OF PHYSICS D-APPLIED PHYSICS, (57) 13, p.Art. 135309Publication EXAFS investigation of Sn local environment in strained and relaxed epitaxial Ge1xSnx films
Oral presentation2015, Synchrotron and Neutron Workshop - SyNeWPublication EXAFS study of Sn local environment in strained and relaxed CVD grown epitaxial GeSn films
Proceedings paper2013, 8th International conference on Silicon Epitaxy and Heterostructures - ICSI-8, 2/06/2013, p.59-60Publication Extended X-ray absorption fine structure investigation of Sn local environment in strained and relaxed epitaxial Ge1-xSnx films
Journal article2015, Journal of Applied Physics, (117) 9, p.95702