Browsing by Author "Terwagne, G."
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Publication Advanced characterization of high-K materials: a nuclear approach
Journal article2002, Nuclear Instruments & Methods in Physics Research B, 190, p.505-509Publication Profile changes and self-sputtering during low energy ion implantation
Proceedings paper2002, Silicon Front-End Junction Formation Technologies, 1/04/2002, p.C7.2Publication Quantification and depth profiling of a ZrO2 (2nm)/A1203 (1nm) layer with NRA, RBS, HRBS, HERD
Oral presentation2001, 15th International Conference on Ion Beam Analysis (IBA); July 2001; Cairns, Australia.