Repository logo Institutional repository
  • Communities & Collections
  • Browse
  • Site
Search repository
High contrast
  1. Home
  2. Browse by Author

Browsing by Author "Thomas, Nicole"

Filter results by typing the first few letters
Now showing 1 - 3 of 3
  • Results Per Page
  • Sort Options
  • Loading...
    Thumbnail Image
    Publication

    Analysis of the pre-epi bake conditions on the defect creation in recessed Si1-xGex S/D junctions

    Bargallo Gonzalez, Mireia
    ;
    Thomas, Nicole
    ;
    Simoen, Eddy  
    ;
    Verheyen, Peter  
    ;
    Hikavyy, Andriy  
    Proceedings paper
    2007, Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes 7, 7/10/2007, p.47-53
  • Loading...
    Thumbnail Image
    Publication

    Impact of the Ge content and the epitaxial thickness on the bandgap shrinkage induced leakage current of recessed Si1-xGex source/drain junctions

    Bargallo Gonzalez, Mireia
    ;
    Simoen, Eddy  
    ;
    Vissouvanadin Soubaretty, Bertrand
    ;
    Thomas, Nicole
    Proceedings paper
    2007, Workshop on Semiconductor Advances for Future Electronics and Sensors - SAFE, 29/11/2007, p.496-200
  • Loading...
    Thumbnail Image
    Publication

    Resistive electrical switching of CuTCNQ based memory with a dedicated switching layer

    Muller, Robert
    ;
    Thomas, Nicole
    ;
    Krebs, Christoph
    ;
    Goux, Ludovic  
    ;
    Wouters, Dirk
    ;
    Genoe, Jan  
    Meeting abstract
    2009, MRS Spring Meeting Symposium H: Materials and Physics for Nonvolatile Memories, 13/04/2009, p.H7.4

Follow imec on

VimeoLinkedInFacebook

The repository

  • Contact us
  • Policy
  • About imec
Privacy statement | Cookie settings