Browsing by Author "Thomas, Nicole"
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Publication Analysis of the pre-epi bake conditions on the defect creation in recessed Si1-xGex S/D junctions
Proceedings paper2007, Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes 7, 7/10/2007, p.47-53Publication Impact of the Ge content and the epitaxial thickness on the bandgap shrinkage induced leakage current of recessed Si1-xGex source/drain junctions
Proceedings paper2007, Workshop on Semiconductor Advances for Future Electronics and Sensors - SAFE, 29/11/2007, p.496-200Publication Resistive electrical switching of CuTCNQ based memory with a dedicated switching layer
Meeting abstract2009, MRS Spring Meeting Symposium H: Materials and Physics for Nonvolatile Memories, 13/04/2009, p.H7.4