Browsing by Author "Tian, Chunsheng"
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Publication Artifacts in SIMS depth profiling
Oral presentation1997, SIMS XI; 8-12 September 1997; Orlando, Fl., USA.Publication Depth Resolution and Ripple Formation on AlxGa 1-xAs
Oral presentation1995, 10th International Conference on Secondary Ion Mass Spectrometry (SIMS X); October 1-6, 1995; Münster, Germany.Publication Effects of oxygen flooding on sputtering and ionization processes during ion bombardment
Publication Positive ion yields under variable oxidation levels
Proceedings paper1997, Secondary Ion Mass Spectrometry - SIMS X : Proceedings of the 10th International Conference, 2/10/1995, p.203-206Publication Secondary ion signal variation during oxygen build-up in Si
Proceedings paper1997, Secondary Ion Mass Spectrometry - SIMS X : Proceedings of the 10th International Conference, 2/10/1995, p.287-290Publication Segregation revisited
Proceedings paper1997, Secondary Ion Mass Spectrometry - SIMS X : Proceedings of the 10th International Conference, 2/10/1995, p.383-386Publication Towards an understanding of ion beam mixing by quantitative internal profiling
Proceedings paper1998, SIMS XI - Secondary Ion Mass Spectrometry, 8/09/1997, p.351-354