Browsing by Author "Tio Castro, David"
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Publication Degradation of the reset switching during endurance testing of a phase-change line cell
Journal article2009, IEEE Transactions on Electron Devices, (56) 2, p.354-358Publication Electromigration study of sub-100nm Cu-lines
Proceedings paper2005, Advanced Metallization Conference 2004 - AMC, p.2532-257Publication Evidence of the prominent role of the time-under-melt parameter in the reset switching of phase-change line cells
Proceedings paper2008, Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design - NVSMW/ICMTD, 18/05/2008, p.37-38Publication Evidence of the thermo-electric Thomson effect and influence on the program conditions and cell optimization in phase-change memory cells
Proceedings paper2007, Technical Digest International Electron Devices Meeting - IEDM, 10/12/2007, p.315-318Publication Transient characteristics of the reset programming of a phase-change line cell and the effect of the reset parameters on the obtained state
Journal article2009, IEEE Transactions on Electron Devices, (56) 7, p.1499-1506Publication Void growth modeling upon electromigration stressing in single damascene cu lines
Journal article2007, Journal of Applied Physics, (102) 12, p.123515