Browsing by Author "Tixier, A."

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Strain measurements in thin film structures by convergent beam electron diffraction

Armigliato, A.
;
Balboni, R.
;
Benedetti, A.
;
Frabboni, S.
;
Tixier, A.
;
Vanhellemont, Jan
Oral presentation
1996, International Conference on Extended Defects in Semiconductors (EDS '96); 8-12 September 1996; Giens, France.
Strain measurements in thin film structures by convergent beam electron diffraction

Armigliato, A.
;
Balboni, R.
;
Benedetti, A.
;
Frabboni, S.
;
Tixier, A.
;
Vanhellemont, Jan
Journal article
1997, Journal de Physique III, (7) 12, p.2375-2381