Browsing by Author "Toledano-Luque, M."
Now showing 1 - 2 of 2
- Results per page
- Sort Options
Publication Charge pumping spectroscopy: HfSiON defect study after substrate hot electron injection
Journal article2007, Microelectronic Engineering, (84) 9_10, p.1943-1946Publication Mobility extraction using RFCV for 80nm MOSFET with 1nm EOT HfSiON/TiN
Journal article2007, Microelectronic Engineering, (84) 9_10, p.1878-1881