Browsing by Author "Toledano-Luque, Maria"
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Publication 6Å EOT Si0.45Ge0.55 pMOSFET with optimized reliability (VDD=1V): Meeting the NBTI lifetime target at ultra-thin EOT
Proceedings paper2010, IEEE International Electron Devices Meeting - IEDM, 6/12/2010, p.70-73Publication New developments in charge pumping measurements on thin stacked dielectrics
Journal article2008, IEEE Transactions on Electron Devices, (55) 11, p.3184-3191Publication Random telegraph noise: from a device physicist's dream to a desiger's nightmare
Proceedings paper2011, 26th Symposium on Microelectronics Technology and Devices - SBMicro, 30/08/2011, p.3-15Publication Recent trends in bias temperature instability
Journal article2011, Journal of Vacuum Science and Technology B, (29) 1, p.01AB01