Browsing by Author "Trémouilles, David"
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Publication Impact of strain on ESD robustness of FinFET devices
Proceedings paper2008, Technical Digest International Electron Devices Meeting - IEDM, 15/12/2008, p.341-344Publication Next generation bulk FinFET devices and their benefits for ESD robustness
Proceedings paper2009, 31st Annual EOS/ESD Symposium, 30/08/2009, p.2A.1