Browsing by Author "Tyaginov, S."
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Publication A drift-diffusion-based analytic description of the energy distribution function for hot-carrier degradation in decananometer NMOSFETs
Proceedings paper2016, 46th European Solid-State Device Research Conference - ESSDERC, 12/09/2016, p.428-431Publication Evaluating Forksheet FET Reliability Concerns by Experimental Comparison with Co-integrated Nanosheets
Proceedings paper2022, IEEE International Reliability Physics Symposium (IRPS), MAR 27-31, 2022