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Browsing by Author "Vaenkatesan, Vidya"

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    Evaluation of local CD and placement distribution on EUV mask and its impact on wafer

    Vaenkatesan, Vidya
    ;
    Van Adrichem, Paul  
    ;
    Kooiman, Marleen
    ;
    Kubis, Michael
    ;
    Van Look, Lieve  
    Proceedings paper
    2019, XXVI Symposium on Photomask and Next-Generation Lithography Mask Technology 2019, 16/04/2019, p.1117807-1-1117807-7
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    Impact of an etched EUV mask black border on imaging and overlay

    de Kruif, Rob
    ;
    Davydova, Natalia
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    Connolly, Brid
    ;
    Fukugami, Norihito
    ;
    Lammers, Ad
    Oral presentation
    2012, International Symposium on Extreme Ultraviolet Lithography - EUVL
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    LCDU decomposition and scaling: mask and resist effects on local MEEF and stochastics

    Gustas, Dominykas
    ;
    Borman, Sam
    ;
    Oorschot, Dorothe
    ;
    Bekaert, Joost  
    ;
    Van Loo, Hilbert
    Proceedings paper
    2024, 2024 International Conference on Extreme Ultraviolet Lithography, SEP 30-OCT 03, 2024, p.Art. 132150Q

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