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Impact of an etched EUV mask black border on imaging and overlay
Publication:
Impact of an etched EUV mask black border on imaging and overlay
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Date
2012
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
de Kruif, Rob
;
Davydova, Natalia
;
Connolly, Brid
;
Fukugami, Norihito
;
Lammers, Ad
;
Philipsen, Vicky
;
Kondo, Shinpei
;
Van Setten, Eelco
;
Vaenkatesan, Vidya
;
Zimmerman, John
;
Harned, Noreen
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1984
since deposited on 2021-10-20
Acq. date: 2025-12-09
Citations
Metrics
Views
1984
since deposited on 2021-10-20
Acq. date: 2025-12-09
Citations