Browsing by Author "Vaitkus, J."
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Publication Excess carrier cross-sectional profiling technique for determination of the surface recombination velocity
Journal article2001, Materials Science in Semiconductor Processing, (4) 1_3, p.125-131Publication IR and MW absorption techniques for bulk and surface recombination control in high-quality silicon
Proceedings paper1995, Ultraclean Semiconductor Processing Technology and Surface Chemical Cleaning and Passivation, 17/04/1995, p.389-394Publication Recombination activity of iron related complexes in silicon
Publication Recombination activity of iron-related complexes in silicon studied with microwave and light-induced absorption techniques
Proceedings paper1994, Proceedings of the 2nd International Symposium on Ultra Clean Processing of Silicon Surfaces - UCPSS, 19/09/1994, p.197-200