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Excess carrier cross-sectional profiling technique for determination of the surface recombination velocity
Publication:
Excess carrier cross-sectional profiling technique for determination of the surface recombination velocity
Date
2001
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Gaubas, Eugenijus
;
Vaitkus, J.
;
Simoen, Eddy
;
Claeys, C.
;
Vanhellemont, Jan
Journal
Materials Science in Semiconductor Processing
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1922
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
1922
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations