Excess carrier cross-sectional profiling technique for determination of the surface recombination velocity

dc.contributor.author	Gaubas, Eugenijus
dc.contributor.author	Vaitkus, J.
dc.contributor.author	Simoen, Eddy
dc.contributor.author	Claeys, C.
dc.contributor.author	Vanhellemont, Jan
dc.contributor.imecauthor	Simoen, Eddy
dc.contributor.orcidimec	Simoen, Eddy::0000-0002-5218-4046
dc.date.accessioned	2021-10-14T16:57:57Z
dc.date.available	2021-10-14T16:57:57Z
dc.date.issued	2001
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/5310
dc.source.beginpage	125
dc.source.endpage	131
dc.source.issue	1_3
dc.source.journal	Materials Science in Semiconductor Processing
dc.source.volume	4
dc.title	Excess carrier cross-sectional profiling technique for determination of the surface recombination velocity
dc.type	Journal article
dspace.entity.type	Publication
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