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Browsing by Author "Van Den Broeke, Douglas"

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    Through pitch low-k1 contact hole imaging with CPL(TM) technology

    Wiaux, Vincent  
    ;
    Bekaert, Joost  
    ;
    Ronse, Kurt  
    ;
    Vandenberghe, Geert  
    ;
    Fung Chen, J.
    ;
    Hsu, Stephen
    Journal article
    2004, Photomask, BACUS News, (20) 12, p.1-11
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    Thumbnail Image
    Publication

    Through pitch low-k1 contact hole imaging with CPLTM technology

    Wiaux, Vincent  
    ;
    Bekaert, Joost  
    ;
    Fung Chen, J.
    ;
    Hsu, Stephen
    ;
    Ronse, Kurt  
    ;
    Socha, Robert
    Proceedings paper
    2004, Photomask and Next-Generation Lithography Mask Technology XI, 14/04/2004, p.585-594

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