Browsing by Author "Van Dinther, G."
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Publication Impact of probe-to-pad contact degradation on the high-frequency charateristics of RF MOSFETs and guidelines to avoid it
Journal article2001, International Journal of RF and Microwave Computer-Aided-Engineering, (11) 3, p.114-120Publication Improved three-step de-embedding method to accurately account for the influence of pad parasitics in silicon on-wafer RF test-structures
Journal article2001, IEEE Trans. Electron Devices, (48) 4, p.737-742