Browsing by Author "Van Uffelen, M."
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Publication Effect of rotation, gate-dielectric and SEG on the noise
; ; Claeys, CorProceedings paper2009, 5th EUROSOI Workshop, 19/01/2009, p.123-124Publication Effect of rotation, gate-dielectric and SEG on the noise behavior of advanced SOI MuGFETs
; Publication Geometry and strain dependence of the proton radiation behavior of MuGFET devices
Journal article2007, IEEE Trans. Nuclear Science, (54) 6, p.2227-2232Publication In-situ recovery of the base current of SiGe NPN HBTs at high gamma dose levels
Proceedings paper2007, Workshop on Semiconductor Advances for Future Electronics and Sensors - SAFE, 29/11/2007, p.452-456Publication Low-frequency noise analysis of g-irradiated p-channel bulk MuGFETs
Proceedings paper2010, 11th International Conference on Ultimate Integration on Silicon - ULIS, 18/03/2010, p.25-28