Publication:
Effect of rotation, gate-dielectric and SEG on the noise behavior of advanced SOI MuGFETs
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
1947 since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations
Metrics
Views
1947 since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations