Browsing by Author "Van de Mieroop, Koen"
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Publication Analysis and modeling of a digital CMOS circuit operation and reliability after gate oxide breakdown: a case study
Journal article2002, Microelectronics Reliability, (42) 4_5, p.555-564Publication Consistent model for short-channel NMOSFET after hard gate oxide breakdown
Journal article2002, IEEE Trans. Electron Devices, (49) 3, p.507-513Publication Consistent model for short-channel nMOSFET post-hard-breakdown characteristics
Proceedings paper2001, Symposium on VLSI Technology. Digest of Technical Papers; 12-14 June 2001; Kyoto, Japan., p.121-122Publication Impact of MOSFET gate oxide breakdown on digital circuit operation and reliability
Journal article2002, IEEE Trans. Electron Devices, (49) 3, p.500-506Publication Impact of oxide breakdown on FET and circuit operation and reliability
Oral presentation2001, SISC-Conference; December 2001; Washington, D.C.