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Browsing by Author "Vecchio, G."

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    Influence of metal and SBT dry-etch on FeCAP properties and role of recovery anneals

    Goux, Ludovic  
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    Paraschiv, Vasile  
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    Boullart, Werner  
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    Lisoni, Judit
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    Schwitters, M.
    ;
    Maes, David
    Oral presentation
    2004, International Symposium on Integrated Ferroelectrics
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    Integration of ferroelectric SrBi2Ta2O9-based capacitors in 0.35 μm CMOS technology

    Lisoni, Judit
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    Johnson, Jo
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    Goux, Ludovic  
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    Schwitters, Michael
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    Paraschiv, Vasile  
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    Maes, David
    Journal article
    2004, Physica Status Solidi C, (1) S1, p.S78-S82
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    Integration of SrBi2Ta2O9 (SBT) based FRAM capacitors: plasma etch issues and solutions

    Paraschiv, Vasile  
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    Boullart, Werner  
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    Vanhaelemeersch, Serge  
    ;
    Lisoni, Judit
    Oral presentation
    2004, E-MRS Spring Meeting Symposium D: Functional Oxides for Advanced Semiconductor Technologies

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