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Browsing by Author "Verbiest, T."

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    Difference in the nonlinear optical response of epitaxial Si on Ge(100) grown from SiH4 at 500°C and from Si3H8 at 350°C due to segregation of Ge

    Valev, V.K.
    ;
    Leys, Frederik
    ;
    Caymax, Matty  
    ;
    Verbiest, T.
    Journal article
    2009, Applied Physics Letters, (94) 6, p.61123
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    Second harmonic generation indicates a better Si/Ge interface quality for higher temperature and with N2 rather than with H2 as the carrier gas

    Valev, V.K.
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    Vanbel, M.K.
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    Vincent, Benjamin  
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    Moshchalkov, V.V.
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    Caymax, Matty  
    ;
    Verbiest, T.
    Journal article
    2011, IEEE Electron Device Letters, (32) 1, p.12-14
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    Si passivation for Ge pMOSFETs: influence of Si precursor during RPCVD growth

    Vincent, Benjamin  
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    Loo, Roger  
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    Vandervorst, Wilfried  
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    Brammertz, Guy  
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    Mitard, Jerome  
    Proceedings paper
    2010, 5th International SiGe Technology and Device Meeting - ISTDM, 24/05/2010
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    Tunneling of holes is observed by second-harmonic generation

    Vanbel, M.K.
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    Afanasiev, Valeri  
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    Adelmann, Christoph  
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    Caymax, Matty  
    ;
    Van Elshocht, Sven  
    Journal article
    2013, Applied Physics Letters, (102) 8, p.82104

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