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Browsing by Author "Wagner, M."

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    Copper through silicon vias studied by the photo-elastic Scanning Infrared Microscope SIREX

    Herms, Martin
    ;
    Wagner, M.
    ;
    De Wolf, Ingrid  
    Journal article
    2016, Microelectronics Reliability, 64, p.330-335
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    Preparation and characterization of rare earth scandates as alternative gate oxide materials

    Wagner, M.
    ;
    Heeg, T.
    ;
    Schubert, J.
    ;
    Zhao, Chao
    ;
    Richard, Olivier  
    ;
    Caymax, Matty  
    ;
    Afanasiev, Valeri  
    Proceedings paper
    2005, 6th European Conference on Ultimate Integration of Silicon - ULIS, 7/04/2005
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    Rare-earth metal scandate high-k layers: promises and problems

    Zhao, Chao
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    Heeg, T.
    ;
    Wagner, M.
    ;
    Schubert, J.
    ;
    Witters, Thomas  
    ;
    Brijs, Bert
    ;
    Bender, Hugo  
    Meeting abstract
    2005, Meeting Abstracts 208th Electrochemical Society Meeting: 3rd International Symposium on High Dielectric Constant Gate Stacks, 16/10/2005
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    Theoretical study of tunneling current in the access region of various heterojunction field-effect transistor structures

    Jansen, Philippe
    ;
    Mizuta, H.
    ;
    Yamaguchi, K.
    ;
    Wagner, M.
    Journal article
    1996, Journal of Applied Physics, (79) 7, p.3603-3607

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