Browsing by Author "Walther, T."

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TEM analysis of Ge-on-Si MOSFET structures with HfO2 dielectric for high performance PMOS device technology

Norris, D.J.
;
Walther, T.
;
Cullis, A.G.
;
Myronov, M.
;
Dobbie, A.
;
Whall, T.
;
Parker, E.H.C.
Journal article
2010, Journal of Physics Conference Series, (209) 1, p.12061
TEM analysis of Si-passivated Ge-on-Si MOSFET structures for high performance PMOS device technology

Norris, D.J.
;
Ross, I.M.
;
Cullis, A.G.
;
Walther, T.
;
Myronov, M.
;
Dobbie, A.
;
Whall, T.
Journal article
2010, Journal of Physics Conference Series, (241) 1, p.12044