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TEM analysis of Si-passivated Ge-on-Si MOSFET structures for high performance PMOS device technology
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TEM analysis of Si-passivated Ge-on-Si MOSFET structures for high performance PMOS device technology
Date
2010
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Norris, D.J.
;
Ross, I.M.
;
Cullis, A.G.
;
Walther, T.
;
Myronov, M.
;
Dobbie, A.
;
Whall, T.
;
Parker, E.H.C.
;
Leadley, D.R.
;
De Jaeger, Brice
;
Lee, Willie
;
Meuris, Marc
Journal
Journal of Physics Conference Series
Abstract
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1916
since deposited on 2021-10-18
Acq. date: 2025-10-24
Citations
Metrics
Views
1916
since deposited on 2021-10-18
Acq. date: 2025-10-24
Citations