Browsing by Author "Wang, Hui"
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Publication EM-induced mass transport at the Cu/barrier interface: a new test structure for rapid assessment at user conditions
Proceedings paper2003, Proceedings of the IEEE International Interconnect Technology Conference - IITC, 2/06/2003, p.21-23Publication Impact of current crowding on electromigration-induced mass transport
Journal article2004, Applied Physics Letters, (84) 4, p.517-519Publication The influence of a structurally induced current crowding on electromigration
Journal article2004, Microelectronic Engineering, (76) 1_4, p.241-244Publication The influence of surface fluctuations on early failures in single-damascene Cu wires: a weakest link approximation analysis
Proceedings paper2004, Proceedings IEEE International Reliability Physics Symposium - IRPS, 25/04/2004, p.625-626Publication Ultra thin oxide reliability : effects of gate doping concentration and poly-Si.SiO2 interface stress relaxation
Proceedings paper1996, International Reliability Physics Symposium - IRPS, 29/04/1996, p.77-83