Browsing by Author "Wang, Liping"
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Publication Reliability aware simulation flow: from TCAD calibration to circuit level analysis
Proceedings paper2015, International Conference on Simulation of Semiconductor Processes and Devices - SISPAD, 9/09/2015, p.152-155Publication Statistical simulations of 6T-SRAM cell ageing using a reliability aware simulation flow
Publication TCAD-based methodology for reliability assessment of nanoscaled MOSFETs
Proceedings paper2015, 11th Conference on Ph.D. Research in Microelectronics and Electronics - PRIME, 29/06/2015, p.270-273