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Browsing by Author "Wang, P."

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    CVD Mn-based self-formed barrier for advanced interconnect technology

    Siew, Yong Kong  
    ;
    Jourdan, Nicolas  
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    Barbarin, Yohan
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    Machillot, Jerome  
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    Demuynck, Steven  
    Proceedings paper
    2013, IEEE International Interconnect Technology Conference - IITC, 13/06/2013, p.2.3
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    Total-ionizing-dose effects and low-frequency noise in 30-nm gate-length Bulk and SOI FinFETs with SiO2/HfO2 gate delectrics

    Gorchichko, M.
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    Cao, Y.
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    Zhang, E.X.
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    Yan, D.
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    Gong, H.
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    Zhao, S.E.
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    Wang, P.
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    Jiang, R.
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    Liang, C.
    Journal article
    2020, IEEE Transactions on Nuclear Science, (67) 1, p.245-252
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    Total-ionizing-dose response of hghly-scaled gate-all-around Si nanowire CMOS transistors

    Gorchichko, Maria
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    Zhang, E.X.
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    Wang, P.
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    Schrimpf, R.
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    Reed, R.
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    Fleetwood, D.M.
    ;
    Bonaldo, S.
    Proceedings paper
    2020, Nuclear & Space Radiation Effects Conference - NSREC, 20/07/2020, p.C-4

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