Browsing by Author "Watanabe, Kenji"
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Publication 2D-3D integration of hexagonal boron nitride and a high-kappa dielectric for ultrafast graphene-based electro-absorption modulators
Publication A practical application of multiple parameters profile characterization (MPPC) using CD-SEM on production wafers using Hyper-NA lithography
Proceedings paper2009, Metrology, Inspection and Process Control for Microlithography XXIII, 22/02/2009, p.72722EPublication Advanced CD-SEM metrology to improve total process control performance for hyper-NA lithography
Publication Asymmetric photoelectric effect: Auger-assisted hot hole photocurrents in transition metal dichalcogenides
Journal article2021, NANOPHOTONICS, (10) 1, p.105-113Publication Correlating Carrier Localization to Optoelectronic Behavior of Monolayer MoS2
Publication Electrically controlled emission from singlet and triplet exciton species in atomically thin light-emitting diodes
Publication Excitons in a reconstructed moire potential in twisted WSe2/WSe2 homobilayers
Journal article2021, NATURE MATERIALS, (20) 4, p.480-+Publication MuGFET Observation and CD measurement by using CD-SEM
Publication Use of the indirect photoluminescence peak as an optical probe of interface defectivity in MoS2
Journal article2020, Advanced Materials Interfaces, (7) 18, p.2000413Publication Validation of CD-SEM etching residue evaluation technique for MuGFET structures
Proceedings paper2009, Metrology, Inspection and Process Control for Microlithography XXIII, 22/02/2009, p.72720Q