Browsing by Author "Weemaes, R."
Now showing 1 - 3 of 3
- Results Per Page
- Sort Options
Publication Atomistic modeling of impurity ion implantation in ultra-thin-body Si devices
Proceedings paper2008, IEEE International Electron Devices Meeting - IEDM, 15/12/2008, p.535-538Publication Minimization of the MuGFET contact resistance by integration of NiSi contacts on epitaxially raised source/drain regions
Publication Performance improvement in narrow MuGFETs by gate work function and source/drain implant engineering
Journal article2009, Solid-State Electronics, (53) 7, p.760-766