Browsing by Author "Woicik, Joseph"
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Publication Atomic layer deposited Gd-doped HfO2 thin films: from high-k dielectrics to ferroelectrics
Meeting abstract2012, Frontiers in Electronic Materials: Correlation Effects and Memristive Phenomena, 17/06/2012, p.411-412Publication Characterization of chemically vapor deposited manganese barrier layers using X-ray absorption fine structure
Journal article2012, Japanese Journal of Applied Physics, (51) 5, p.05EB01Publication Characterization of CVD-Mn barrier layers using X-ray absorption fine structure
Oral presentation2011, Advanced Metallization Conference - ADMETAPublication Phase identification of self-forming Cu-Mn based diffusion barriers on p-SiOC:H and SiO2 dielectrics using x-ray absorption fine structures
Journal article2009, Applied Physics Letters, (94) 4, p.42112