Browsing by Author "Wu, Wei"
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Publication Machine Learning-based SEM Images Contour Extraction Data Augmentation
Proceedings paper2025, 2025 Conference on Metrology Inspection and Process Control-Annual, 2025-02-24, p.134262XPublication Process, design and optical proximity correction requirements for the 65nm device generation
;Lucas, Kevin ;Montgomery, Patrick ;Litt, Lloyd C. ;Conley, Will ;Postnikov, Sergei V.Wu, WeiProceedings paper2003, Optical Microlithography XVI, 23/02/2003, p.408-419Publication The IPIN 2019 indoor localisation competition - description and results
;Potorti, Francesco ;Park, Sangjoon ;Crivello, Antonino ;Palumbo, FilippoGirolami, MicheleJournal article2020-11, IEEE Access, 8, p.206674-206718