Browsing by Author "Yan, L."

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1/f noise study on strained Si0.8Ge0.2 p-channel MOSFETs with high-k/poly Si gate stack

Yan, L.
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Simoen, Eddy
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Olsen, S.H.
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Akheyar, Amal
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Claeys, Cor
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O'Neill, A.G.
Journal article
2009, Solid-State Electronics, (53) 11, p.1177-1182
Strained Si/SiGe MOS technology

Olsen, S.
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Yan, L.
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Agaiby, R.
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Escobedo-Cousin, E.
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O'Neill, A.G.
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Hellstrom, P.-E.
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Ostling, M.
Oral presentation
2007, 4th International Symposium on Advanced Gate Stack technology
Strained Si/SiGe MOS technology: improving gate dielectric integrity

Olsen, S.H.
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Yan, L.
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Agaiby, R.
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Escobedo-Cousin, A.G.
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O'Neil, A.G.
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Hellstrom, P.E.
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Ostling, M.
Journal article
2009, Microelectronic Engineering, (86) 3, p.218-223