Browsing by Author "Yao, Thierry"
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Publication Characterization of moving bits (MBs) and QBD in wet/dry tunnel oxides for floating gate type nonvolatile memory (FG-NVM) applications
Journal article2004, Solid-State Electronics, (48) 10_11, p.1911-1915Publication Characterization of tunnel oxides for non-volatile memory (NVM) applications
Proceedings paper2003, Proceedings International Semiconductor Device Research Symposium, 10/12/2003, p.33-34Publication Failure rate predictions for 0.35μm flash EEPROM memories from accelerated read disturb tests
Proceedings paper2004-09, Proceedings of the 34th European Solid-State Device Research Conference - ESSDERC, 21/09/2004, p.269-272