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Browsing by Author "Zenari, Michele"

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    Impact of the Oxide Aperture Width on the Degradation of 845 Nm VCSELs for Silicon Photonics

    Zenari, Michele
    ;
    Buffolo, Matteo
    ;
    Rampazzo, Fabiana
    ;
    De Santi, Carlo
    ;
    Rossi, Francesca
    Journal article
    2025, IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, (31) 2, p.1500209
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    Influence of zinc diffusion on the optical performance of heterogeneously integrated C-band lasers

    Zenari, Michele  
    ;
    Pan, Biwei  
    ;
    Zhang, Jing  
    ;
    Neel, Delphine
    ;
    Ramirez, Joan
    ;
    Roelkens, Gunther  
    Journal article
    2026, OPTICS EXPRESS, (34) 8, p.13882-13893
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    Modeling the Electrical Degradation of Micro-Transfer Printed 845 nm VCSILs for Silicon Photonics

    Zenari, Michele
    ;
    Buffolo, Matteo
    ;
    De Santi, Carlo
    ;
    Goyvaerts, Jeroen
    ;
    Grabowski, Alexander
    Journal article
    2024, IEEE TRANSACTIONS ON ELECTRON DEVICES, (71) 2, p.431-438
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    Optical Degradation of 845 nm VCSELs With Different Oxide Apertures for Silicon Photonics

    Zenari, Michele
    ;
    Buffolo, Matteo  
    ;
    Perale, Filippo
    ;
    De Santi, Carlo
    ;
    Goyvaerts, Jeroen
    Journal article
    2026, IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, (32) 6, p.1-8
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    Understanding the Optical Degradation of 845 nm Micro-Transfer-Printed VCSILs for Photonic Integrated Circuits

    Zenari, Michele
    ;
    Buffolo, Matteo
    ;
    Fornasier, Mirko
    ;
    De Santi, Carlo
    ;
    Goyvaerts, Jeroen  
    Journal article
    2023, IEEE JOURNAL OF QUANTUM ELECTRONICS, (59) 4, p.Art. 2400210

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