Understanding the Optical Degradation of 845 nm Micro-Transfer-Printed VCSILs for Photonic Integrated Circuits

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Author(s)

Zenari, Michele

;

Buffolo, Matteo

;

Fornasier, Mirko

;

De Santi, Carlo

;

Goyvaerts, Jeroen

;

Grabowski, Alexander

;

Gustavsson, Johan

;

Kumari, Sulakshna

;

;

;

Larsson, Anders

;

Roelkens, Gunther

;

Meneghesso, Gaudenzio

;

;

Meneghini, Matteo

Journal

IEEE JOURNAL OF QUANTUM ELECTRONICS

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1161 since deposited on 2023-07-08

Acq. date: 2025-10-27