Understanding the Optical Degradation of 845 nm Micro-Transfer-Printed VCSILs for Photonic Integrated Circuits

Zenari, Michele; Buffolo, Matteo; Fornasier, Mirko; De Santi, Carlo; Goyvaerts, Jeroen; Grabowski, Alexander; Gustavsson, Johan; Kumari, Sulakshna; Stassen, Andim; Baets, Roel; Larsson, Anders; Roelkens, Gunther; Meneghesso, Gaudenzio; Zanoni, Enrico; Meneghini, Matteo

doi:10.1109/JQE.2023.3283514

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Understanding the Optical Degradation of 845 nm Micro-Transfer-Printed VCSILs for Photonic Integrated Circuits

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2023

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https://doi.org/10.1109/JQE.2023.3283514

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Meneghesso, Gaudenzio

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Zanoni, Enrico

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Meneghini, Matteo

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IEEE JOURNAL OF QUANTUM ELECTRONICS

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Acq. date: 2026-01-26

Understanding the Optical Degradation of 845 nm Micro-Transfer-Printed VCSILs for Photonic Integrated Circuits

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