Publication:

Understanding the Optical Degradation of 845 nm Micro-Transfer-Printed VCSILs for Photonic Integrated Circuits

Date

2023
Journal article
https://doi.org/10.1109/JQE.2023.3283514
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dc.contributor.authorZenari, Michele
dc.contributor.authorBuffolo, Matteo
dc.contributor.authorFornasier, Mirko
dc.contributor.authorDe Santi, Carlo
dc.contributor.authorGoyvaerts, Jeroen
dc.contributor.authorGrabowski, Alexander
dc.contributor.authorGustavsson, Johan
dc.contributor.authorKumari, Sulakshna
dc.contributor.authorStassen, Andim
dc.contributor.authorBaets, Roel
dc.contributor.authorLarsson, Anders
dc.contributor.authorRoelkens, Gunther
dc.contributor.authorMeneghesso, Gaudenzio
dc.contributor.authorZanoni, Enrico
dc.contributor.authorMeneghini, Matteo
dc.contributor.imecauthorGoyvaerts, Jeroen
dc.contributor.imecauthorKumari, Sulakshna
dc.contributor.imecauthorStassen, Andim
dc.contributor.imecauthorBaets, Roel
dc.contributor.imecauthorRoelkens, Gunther
dc.contributor.orcidimecBaets, Roel::0000-0003-1266-1319
dc.contributor.orcidimecRoelkens, Gunther::0000-0002-4667-5092
dc.contributor.orcidimecStassen, Andim::0000-0001-8819-9592
dc.date.accessioned2023-08-09T09:58:33Z
dc.date.available2023-07-08T21:01:10Z
dc.date.available2023-08-09T09:58:33Z
dc.date.embargo9999-12-31
dc.date.issued2023
dc.description.wosFundingTextThis work was supported in part by the Italian Ministry of Education, Universities and Research (MIUR) through the Aegis of the "Fondo per il finanziamento dei dipartimenti universitari di eccellenza" Initiative by the Project Internet of Things: Sviluppi Metodologici, Tecnologici E Applicativi under Grant Law 232/2016 (2018-2022). (Corresponding author: Michele Zenari.)
dc.identifier.doi10.1109/JQE.2023.3283514
dc.identifier.issn0018-9197
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/42135
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpageArt. 2400210
dc.source.endpagena
dc.source.issue4
dc.source.journalIEEE JOURNAL OF QUANTUM ELECTRONICS
dc.source.numberofpages10
dc.source.volume59
dc.subject.keywordsFAILURE
dc.title

Understanding the Optical Degradation of 845 nm Micro-Transfer-Printed VCSILs for Photonic Integrated Circuits

dc.typeJournal article
dspace.entity.typePublication
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