Modeling the Electrical Degradation of Micro-Transfer Printed 845 nm VCSILs for Silicon Photonics

Meneghini, Matteo

doi:10.1109/TED.2023.3346370

Simple item page Full metadata Statistics

Files

Published version 3.16 MB

Author(s)

;

;

;

;

;

;

;

;

;

Meneghesso, Gaudenzio

;

Zanoni, Enrico

;

Meneghini, Matteo

Journal

IEEE TRANSACTIONS ON ELECTRON DEVICES

Metrics

82 since deposited on 2024-01-24

Acq. date: 2025-10-27

662 since deposited on 2024-01-24

Acq. date: 2025-10-27

Modeling the Electrical Degradation of Micro-Transfer Printed 845 nm VCSILs for Silicon Photonics

Date

Files

Author(s)

Journal

Abstract

Description

Metrics

Downloads

Views

Citations

Metrics

Downloads

Views

Citations