Publication:

Modeling the Electrical Degradation of Micro-Transfer Printed 845 nm VCSILs for Silicon Photonics

Date

2024
Journal article
https://doi.org/10.1109/ted.2023.3346370
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Published version 3.16 MB

Author(s)

Zenari, Michele
;
Buffolo, Matteo
;
De Santi, Carlo
;
Goyvaerts, Jeroen
;
Grabowski, Alexander
;
Gustavsson, Johan
;
Baets, Roel  
;
Larsson, Anders
;
Roelkens, Gunther  
;
Meneghesso, Gaudenzio
;
Zanoni, Enrico
;
Meneghini, Matteo

Journal

IEEE TRANSACTIONS ON ELECTRON DEVICES

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172 since deposited on 2024-01-24
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