Publication:

Modeling the Electrical Degradation of Micro-Transfer Printed 845 nm VCSILs for Silicon Photonics

Date

2024
Journal article
https://doi.org/10.1109/TED.2023.3346370
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dc.contributor.authorZenari, Michele
dc.contributor.authorBuffolo, Matteo
dc.contributor.authorDe Santi, Carlo
dc.contributor.authorGoyvaerts, Jeroen
dc.contributor.authorGrabowski, Alexander
dc.contributor.authorGustavsson, Johan
dc.contributor.authorBaets, Roel
dc.contributor.authorLarsson, Anders
dc.contributor.authorRoelkens, Gunther
dc.contributor.authorMeneghesso, Gaudenzio
dc.contributor.authorZanoni, Enrico
dc.contributor.authorMeneghini, Matteo
dc.contributor.imecauthorBaets, Roel
dc.contributor.imecauthorRoelkens, Gunther
dc.contributor.orcidimecBaets, Roel::0000-0003-1266-1319
dc.contributor.orcidimecRoelkens, Gunther::0000-0002-4667-5092
dc.date.accessioned2024-08-22T08:55:43Z
dc.date.available2024-01-24T17:36:59Z
dc.date.available2024-08-22T08:55:43Z
dc.date.embargo2024-01-03
dc.date.issued2024
dc.identifier.doi10.1109/TED.2023.3346370
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/43450
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage431
dc.source.endpage438
dc.source.issue2
dc.source.journalIEEE TRANSACTIONS ON ELECTRON DEVICES
dc.source.numberofpages8
dc.source.volume71
dc.title

Modeling the Electrical Degradation of Micro-Transfer Printed 845 nm VCSILs for Silicon Photonics

dc.typeJournal article
dspace.entity.typePublication
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