Browsing by Author "Zhang, Cher Xuan"

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Comparison of charge pumping and 1/f noise in irradiated Ge pMOSFETs

Francis, S.A.
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Zhang, Cher Xuan
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Zhang, En Xia
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Fleetwood, Daniel M.
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Schrimpf, Ronald D.
Proceedings paper
2011, European Conference on Radiation Effects on Component and Systems - RADECS, 19/09/2011, p.24-27
Effect of ionizing radiation on defects and 1/f noise in Ge pMOSFETs

Zhang, Cher Xuan
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Zhang, E. Xia
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Fleetwood, Dan M.
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Schrimpf, Ronald D
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Galloway, Kenneth F.
Proceedings paper
2010, 11th European Conference on Radiation and its Effects on Components and Systems - RADECS, 20/09/2010
Effects of negative-bias-temperature-instability on low-frequency noise in SiGe p MOSFETs

Duan, Guo Xing
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Hachtel, Jordan
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Zhang, En Xia
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Zhang, Cher Xuan
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Fleetwood, Daniel
Journal article
2016, IEEE Transactions on Device and Materials Reliability, (16) 4, p.541-548
Effects of processing and radiation bias on leakage currents in Ge pMOSFETs

Zhang, Cher Xuan
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Zhang, En Xia
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Fleetwood, Daniel M.
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Schrimpf, Ronald D.
;
Galloway, Kenneth F.
Journal article
2010, IEEE Transactions on Nuclear Science, (57) 6, p.3066-3070