Publication:
Effects of processing and radiation bias on leakage currents in Ge pMOSFETs
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
1913 since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations
Metrics
Views
1913 since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations