Browsing by Author "Zhang, Weihang"
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Publication Analysis of Leakage Mechanisms in AlN Nucleation Layers on p-Si and p-SOI Substrates
Journal article2019, IEEE Transactions on Electron Devices, (66) 4, p.1849-1855Publication Defect Assessment in AlN Nucleation Layers Grown on Silicon and Silicon-on-Insulator Substrates
Proceedings paper2019, China Semiconductor Technology International Conference CSTIC 2019, 20/03/2019, p.1-4