Browsing by Author "Zhao, S. E."
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Publication Exploring the DC reliability metrics for scaled GaN-on-Si devices targeted for RF/5G applications
Proceedings paper2020, IEEE International Reliability Physics Symposium (IRPS), APR 28-MAY 30, 2020Publication Low-frequency Noise and Defects in Copper and Ruthenium Resistors
Journal article2019, Applied Physics Letters, (114) 20, p.203501