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Exploring the DC reliability metrics for scaled GaN-on-Si devices targeted for RF/5G applications
Publication:
Exploring the DC reliability metrics for scaled GaN-on-Si devices targeted for RF/5G applications
Date
2020
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Zhao, S. E.
;
Putcha, Vamsi
;
Bury, Erik
;
Franco, Jacopo
;
Walke, Amey
;
Peralagu, Uthayasankaran
;
Zhao, Ming
;
Alian, AliReza
;
Kaczer, Ben
;
Waldron, Niamh
;
Linten, Dimitri
;
Parvais, Bertrand
;
Collaert, Nadine
Journal
na
Abstract
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1859
since deposited on 2021-11-02
Acq. date: 2025-10-28
Citations
Metrics
Views
1859
since deposited on 2021-11-02
Acq. date: 2025-10-28
Citations