Publication:
Exploring the DC reliability metrics for scaled GaN-on-Si devices targeted for RF/5G applications
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1869 since deposited on 2021-11-02
1last month
Acq. date: 2026-07-18
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Statistics
Views
1869 since deposited on 2021-11-02
1last month
Acq. date: 2026-07-18
Citations