Publication:
Exploring the DC reliability metrics for scaled GaN-on-Si devices targeted for RF/5G applications
Date
| dc.contributor.author | Zhao, S. E. | |
| dc.contributor.author | Putcha, Vamsi | |
| dc.contributor.author | Bury, Erik | |
| dc.contributor.author | Franco, Jacopo | |
| dc.contributor.author | Walke, Amey | |
| dc.contributor.author | Peralagu, Uthayasankaran | |
| dc.contributor.author | Zhao, Ming | |
| dc.contributor.author | Alian, AliReza | |
| dc.contributor.author | Kaczer, Ben | |
| dc.contributor.author | Waldron, Niamh | |
| dc.contributor.author | Linten, Dimitri | |
| dc.contributor.author | Parvais, Bertrand | |
| dc.contributor.author | Collaert, Nadine | |
| dc.contributor.imecauthor | Putcha, V | |
| dc.contributor.imecauthor | Bury, E. | |
| dc.contributor.imecauthor | Franco, J. | |
| dc.contributor.imecauthor | Walke, A. | |
| dc.contributor.imecauthor | Peralagu, U. | |
| dc.contributor.imecauthor | Zhao, M. | |
| dc.contributor.imecauthor | Alian, A. | |
| dc.contributor.imecauthor | Kaczer, B. | |
| dc.contributor.imecauthor | Waldron, N. | |
| dc.contributor.imecauthor | Linten, D. | |
| dc.contributor.imecauthor | Parvais, B. | |
| dc.contributor.imecauthor | Collaert, N. | |
| dc.contributor.imecauthor | Putcha, Vamsi | |
| dc.contributor.imecauthor | Bury, Erik | |
| dc.contributor.imecauthor | Franco, Jacopo | |
| dc.contributor.imecauthor | Walke, Amey | |
| dc.contributor.imecauthor | Peralagu, Uthayasankaran | |
| dc.contributor.imecauthor | Zhao, Ming | |
| dc.contributor.imecauthor | Alian, AliReza | |
| dc.contributor.imecauthor | Kaczer, Ben | |
| dc.contributor.orcidimec | Putcha, Vamsi::0000-0003-1907-5486 | |
| dc.contributor.orcidimec | Bury, Erik::0000-0002-5847-3949 | |
| dc.contributor.orcidimec | Franco, Jacopo::0000-0002-7382-8605 | |
| dc.contributor.orcidimec | Peralagu, Uthayasankaran::0000-0001-9166-4408 | |
| dc.contributor.orcidimec | Zhao, Ming::0000-0002-0856-851X | |
| dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
| dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
| dc.contributor.orcidimec | Parvais, Bertrand::0000-0003-0769-7069 | |
| dc.contributor.orcidimec | Collaert, Nadine::0000-0002-8062-3165 | |
| dc.date.accessioned | 2021-11-23T11:23:16Z | |
| dc.date.available | 2021-11-02T16:05:23Z | |
| dc.date.available | 2021-11-23T11:23:16Z | |
| dc.date.issued | 2020 | |
| dc.identifier.eisbn | 978-1-7281-3199-3 | |
| dc.identifier.issn | 1541-7026 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/38212 | |
| dc.publisher | IEEE | |
| dc.source.conference | IEEE International Reliability Physics Symposium (IRPS) | |
| dc.source.conferencedate | APR 28-MAY 30, 2020 | |
| dc.source.conferencelocation | Dallas, TX, USA | |
| dc.source.journal | na | |
| dc.source.numberofpages | 8 | |
| dc.subject.keywords | DEGRADATION | |
| dc.title | Exploring the DC reliability metrics for scaled GaN-on-Si devices targeted for RF/5G applications | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: | ||