Browsing by Author "Zhao, Simeng"
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Publication Gate bias and length dependences of total-ionizing-dose effects in InGaAs FinFETs on bulk Si
Proceedings paper2018-09, Radiation Effects on Components and Systems - RADECS, 16/09/2018Publication Total-ionizing-dose effects in InGaAs MOSFETs with high-k gate dielectrics and InP substrates
Journal article2020, IEEE Transactions on Nuclear Science, (67) 7, p.1312-1319