Browsing by Author "Zhao, Simeng E."
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Publication Impacts of Through-Silicon Vias on Total-Ionizing-Dose Effects and Low-Frequency Noise in FinFETs
Publication Total-ionizing-dose effects on InGaAs FinFETs with improved gate stack
Proceedings paper2019, Radiation Effects on Devices & ICs 2019 - RADECS, 16/09/2019Publication Total-ionizing-dose effects on InGaAs FinFETs with modified gate stack
Journal article2020-01, IEEE Transactions on Nuclear Science, (67) 1, p.253-259