Impacts of Through-Silicon Vias on Total-Ionizing-Dose Effects and Low-Frequency Noise in FinFETs

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Author(s)

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Gorchichko, Mariia

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Zhao, Simeng E.

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Hiblot, Gaspard

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Van Huylenbroeck, Stefaan

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Alles, Michael L.

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Reed, Robert A.

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Fleetwood, Daniel M.

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Schrimpf, Ronald D.

Journal

IEEE TRANSACTIONS ON NUCLEAR SCIENCE

Metrics

1939 since deposited on 2022-02-24

Acq. date: 2025-10-23