Browsing by Author "Zullino, L."

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Characterization and modeling of transient device behavior under CDM ESD stress

Willemen, J.
;
Andreini, A.
;
De Heyn, Vincent
;
Esmark, K.
;
Etherton, M.
;
Gieser, H.
Proceedings paper
2003, Proceedings 25th EOS/ESD Symposium, 21/09/2003, p.88-97
Characterization and modeling of transient device behavior under CMD ESD stress

Willemen, J.
;
Andreini, A.
;
De Heyn, Vincent
;
Esmark, K.
;
Etherton, M.
;
Gieser, H.
Journal article
2004, Journal of Electrostatics, (62) 2_3, p.133-153