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Browsing by Author "de Bokx, P."

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    Effect of x-ray irradiation on the electrical characteristics of ultra-thin gate oxides

    Houssa, Michel  
    ;
    De Gendt, Stefan  
    ;
    de Bokx, P.
    ;
    Mertens, Paul  
    ;
    Heyns, Marc  
    Journal article
    1999, Semiconductor Science and Technology, (14) 9, p.741-746
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    X-ray irradiation effect on the reliability of ultra-thin gate oxides and oxynitrides

    Houssa, Michel  
    ;
    De Gendt, Stefan  
    ;
    de Bokx, P.
    ;
    Mertens, Paul  
    ;
    Heyns, Marc  
    Journal article
    1999, Microelectronic Engineering, (48) 1_4, p.43-46

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